"Multiple Fault Diagnosis in Logic Circuits Using EB Tester and ..."

Hiroshi Takahashi et al. (1999)

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DOI: 10.1109/ATS.1999.810773

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida:
Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. Asian Test Symposium 1999: 341-346

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