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2020 – today
- 2024
[j6]Jani Babu Shaik
, Siona Menezes Picardo, Sonal Singhal, Nilesh Goel:
Reliability-aware design of Integrate-and-Fire silicon neurons. Integr. 94: 102101 (2024)- 2022
- [j5]Jani Babu Shaik, Aadhitiya VS, Sonal Singhal, Nilesh Goel:
Reliability-aware design of temporal neuromorphic encoder for image recognition. Int. J. Circuit Theory Appl. 50(4): 1130-1142 (2022) - [j4]Siona Menezes Picardo, Jani Babu Shaik, Sonal Singhal, Nilesh Goel:
Enabling efficient rate and temporal coding using reliability-aware design of a neuromorphic circuit. Int. J. Circuit Theory Appl. 50(12): 4234-4250 (2022) - [j3]Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel:
Impact of various NBTI distributions on SRAM performance for FinFET technology. Integr. 83: 60-66 (2022) - [i2]Aadhitiya VS, Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel:
Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition. CoRR abs/2205.09519 (2022) - [i1]Jani Babu Shaik, Rohit Singh, Siona Menezes Picardo, Nilesh Goel, Sonal Singhal:
Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits. CoRR abs/2205.10152 (2022) - 2020
- [j2]Jani Babu Shaik, Sonal Singhal, Nilesh Goel:
Analysis of SRAM metrics for data dependent BTI degradation and process variability. Integr. 72: 148-162 (2020)
2010 – 2019
- 2018
- [c3]Sarthak Prakash Chaudhari, Jani Babu Shaik, Sonal Singhal, Nilesh Goel:
Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation. iSES 2018: 90-93 - 2015
- [c2]Nilesh Goel, Tejas Naphade, Souvik Mahapatra:
Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress. IRPS 2015: 4 - [c1]Nilesh Goel, P. Dubey, J. Kawa, S. Mahapatra:
Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages. IRPS 2015: 5 - 2014
- [j1]Nilesh Goel, Kaustubh Joshi, S. Mukhopadhyay, N. Nanaware, Souvik Mahapatra:
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs. Microelectron. Reliab. 54(3): 491-519 (2014)
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