"Analysis of SRAM metrics for data dependent BTI degradation and process ..."

Jani Babu Shaik, Sonal Singhal, Nilesh Goel (2020)

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DOI: 10.1016/J.VLSI.2020.01.006

access: closed

type: Journal Article

metadata version: 2020-10-26

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Jani Babu Shaik, Sonal Singhal, Nilesh Goel:
Analysis of SRAM metrics for data dependent BTI degradation and process variability. Integr. 72: 148-162 (2020)

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