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Robert Derix

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Journal Articles

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2016
[j2]
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  - journals/mr/ElgerMHSLKD16
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  - https://dblp.org/rec/journals/mr/ElgerMHSLKD16
Gordon Elger, Dominik Müller, Alexander Hanß, Maximilian Schmid, E. Liu, Udo Karbowski, Robert Derix:
Transient thermal analysis for accelerated reliability testing of LEDs. Microelectron. Reliab. 64: 605-609 (2016)
2015
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Gordon Elger, Shri Vishnu Kandaswamy, E. Liu, Alexander Hanss, Maximilian Schmid, Robert Derix, Fosca Conti:
Analysis of solder joint reliability of high power LEDs by transient thermal testing and transient finite element simulations. Microelectron. J. 46(12): 1230-1238 (2015)

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