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"Transient thermal analysis for accelerated reliability testing of LEDs."
Gordon Elger et al. (2016)
- Gordon Elger, Dominik Müller, Alexander Hanß, Maximilian Schmid, E. Liu, Udo Karbowski, Robert Derix:
Transient thermal analysis for accelerated reliability testing of LEDs. Microelectron. Reliab. 64: 605-609 (2016)
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