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ORCIDOlivier Ginez
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2010 – 2019
- 2011
[c8]Christophe Muller
, Damien Deleruyelle, Olivier Ginez, Jean-Michel Portal, Marc Bocquet:
Design challenges for prototypical and emerging memory concepts relying on resistance switching. CICC 2011: 1-7
2000 – 2009
- 2009
- [j2]Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash. J. Electron. Test. 25(2-3): 127-144 (2009) - [c7]Olivier Ginez, Jean-Michel Portal, Hassen Aziza:
An on-line testing scheme for repairing purposes in Flash memories. DDECS 2009: 120-123 - [c6]Olivier Ginez, Jean-Michel Portal, Christophe Muller:
Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. ETS 2009: 61-66 - 2008
- [j1]Hassen Aziza, Emmanuel Bergeret, Jean-Michel Portal, Olivier Ginez:
A Novel Low Power Oriented Design Methodology for Analog Blocks. J. Low Power Electron. 4(1): 60-67 (2008) - [c5]Olivier Ginez, Jean-Michel Portal, Hassen Aziza:
A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. ITC 2008: 1-10 - 2007
- [c4]Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. ETS 2007: 77-84 - [c3]Olivier Ginez, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Jean Michel Daga:
A concurrent approach for testing address decoder faults in eFlash memories. ITC 2007: 1-10 - [c2]Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. VTS 2007: 47-52 - 2006
- [c1]Olivier Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
An Overview of Failure Mechanisms in Embedded Flash Memories. VTS 2006: 108-113
Coauthor Index
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