"Retention and Reliability Problems in Embedded Flash Memories: Analysis ..."

Olivier Ginez et al. (2007)

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DOI: 10.1109/VTS.2007.52

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. VTS 2007: 47-52

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