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Razi Seyyedi
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2020 – today
- 2023
- [b1]Razi Seyyedi:
Globally Accurate Locally Inaccurate (GALI): On the Combination of Time-Triggered Architectures with Instruction Accurate Simulators for the Analysis of System Behavior. University of Oldenburg, Germany, 2023 - 2020
- [j4]Razi Seyyedi, Sören Schreiner, Maher Fakih, Kim Grüttner, Wolfgang Nebel:
Functional test environment for time-triggered control systems in complex MPSoCs. Microprocess. Microsystems 76: 103072 (2020)
2010 – 2019
- 2018
- [c7]Razi Seyyedi, Sören Schreiner, Maher Fakih, Kim Grüttner, Wolfgang Nebel:
Functional Test Environment for Time-Triggered Control Systems in Complex MPSoCs Using GALI. DSD 2018: 711-718 - [c6]Sören Schreiner, Razi Seyyedi, Maher Fakih, Kim Grüttner, Wolfgang Nebel:
Towards power management verification of time-triggered systems using virtual platforms. SAMOS 2018: 81-88 - 2017
- [j3]Maher Fakih, Alina Lenz, Mikel Azkarate-askasua, Javier Coronel, Alfons Crespo, Simon Davidmann, Juan Carlos Diaz Garcia, Nera González Romero, Kim Grüttner, Sören Schreiner, Razi Seyyedi, Roman Obermaisser, Adele Maleki, Johnny Öberg, Mohamed Tagelsir Mohammadat, Jon Pérez-Cerrolaza, Ingo Sander, Ingemar Söderquist:
SAFEPOWER project: Architecture for safe and power-efficient mixed-criticality systems. Microprocess. Microsystems 52: 89-105 (2017) - [c5]Razi Seyyedi, Mohamed Tagelsir Mohammadat, Maher Fakih, Kim Grüttner, Johnny Öberg, Duncan Graham:
Towards virtual prototyping of synchronous real-time systems on noc-based MPSoCs. SIES 2017: 1-4 - 2016
- [j2]Mojtaba Ebrahimi, Parthasarathy Murali B. Rao, Razi Seyyedi, Mehdi Baradaran Tahoori:
Low-Cost Multiple Bit Upset Correction in SRAM-Based FPGA Configuration Frames. IEEE Trans. Very Large Scale Integr. Syst. 24(3): 932-943 (2016) - 2015
- [j1]Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi:
Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(10): 1586-1599 (2015) - [c4]Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, Mehdi Baradaran Tahoori:
Event-driven transient error propagation: A scalable and accurate soft error rate estimation approach. ASP-DAC 2015: 743-748 - 2014
- [c3]Parthasarathy M. B. Rao, Mojtaba Ebrahimi, Razi Seyyedi, Mehdi Baradaran Tahoori:
Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes. DAC 2014: 212:1-212:6 - [c2]Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu:
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales. DATE 2014: 1-6 - 2013
- [c1]Mohammad Yousef Zarei, Reza Asadpour, Siamak Mohammadi, Ali Afzali-Kusha, Razi Seyyedi:
Modeling symmetrical independent gate FinFET using predictive technology model. ACM Great Lakes Symposium on VLSI 2013: 299-304
Coauthor Index
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