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Robert Entner

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2000 – 2009

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2007
[j2]
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Robert Entner, Tibor Grasser, Oliver Triebl, Hubert Enichlmair, Rainer Minixhofer:
Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. Microelectron. Reliab. 47(4-5): 697-699 (2007)
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Markus Karner, Andreas Gehring, M. Wagner, Robert Entner, Stefan Holzer, Wolfgang Goes, M. Vasicek, Tibor Grasser, Hans Kosina, Siegfried Selberherr:
VSP - A gate stack analyzer. Microelectron. Reliab. 47(4-5): 704-708 (2007)

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