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ORCIDToufik Bentrcia
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Journal Articles
- 2023
[j8]Toufik Bentrcia
, Abdelaziz Mennouni:
On the solution behavior of a nonlinear time-fractional Klein-Gordon equation: Theoretical study and numerical validation. Commun. Nonlinear Sci. Numer. Simul. 125: 107384 (2023)- 2022
- [j7]Tarek Berghout, Mohamed Benbouzid, Toufik Bentrcia, Yassine Amirat, Leila Hayet Mouss:
Exposing Deep Representations to a Recurrent Expansion with Multiple Repeats for Fuel Cells Time Series Prognosis. Entropy 24(7): 1009 (2022) - [j6]Mohammed Bouzenita, Leila Hayet Mouss, Farid Melgani, Toufik Bentrcia:
New fusion frameworks including explicit weighting functions for the remaining useful life prognostics. Expert Syst. Appl. 189: 116091 (2022) - 2021
- [j5]Tarek Berghout, Mohamed Benbouzid, S. M. Muyeen, Toufik Bentrcia, Leila Hayet Mouss:
Auto-NAHL: A Neural Network Approach for Condition-Based Maintenance of Complex Industrial Systems. IEEE Access 9: 152829-152840 (2021) - 2020
- [j4]Mohammed Bouzenita, Leila Hayet Mouss, Farid Melgani, Toufik Bentrcia:
New fusion and selection approaches for estimating the remaining useful life using Gaussian process regression and induced ordered weighted averaging operators. Qual. Reliab. Eng. Int. 36(6): 2146-2169 (2020) - 2017
- [j3]Toufik Bentrcia, Fayçal Djeffal, Elasaad Chebaki:
Approach for designing and modelling of nanoscale DG MOSFET devices using Kriging metamodelling technique. IET Circuits Devices Syst. 11(6): 618-623 (2017) - 2013
- [j2]Toufik Bentrcia, Fayçal Djeffal, M. Chahdi:
An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects. Microelectron. Reliab. 53(4): 520-527 (2013) - 2011
- [j1]Fayçal Djeffal, Toufik Bentrcia, Mohamed Amir Abdi, Toufik Bendib:
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectron. Reliab. 51(3): 550-555 (2011)
Conference and Workshop Papers
- 2020
- [c6]Hichem Ferhati, Fayçal Djeffal, Toufik Bentrcia:
Novel Infrared phototransistor based on Junctionless TFET design: Numerical Analysis and Performance Assessment. ICIST 2020: 37:1-37:5 - [c5]Toufik Bentrcia, Fayçal Djeffal, Hichem Ferhati:
An ANFIS-based Computation to Study the Degradation-related Ageing effects in Nanoscale GAA-TFETs. ICIST 2020: 38:1-38:5 - [c4]Hichem Ferhati, Fayçal Djeffal, Toufik Bentrcia:
Role of Material Gate Engineering in Improving Gate All Around Junctionless (GAAJL) MOSFET Reliability Against Hot-Carrier Effects. ICM 2020: 1-4 - 2018
- [c3]Badreddine Zerroumda, Fayçal Djeffal, Toufik Bentrcia, Hichem Ferhati:
Numerical Analysis of 4H-SiC MOSFET Design Including High-k Gate Dielectrics for Power electronic Applications. ICSENT 2018: 35:1-35:5 - [c2]Elasaad Chebaki, Fayçal Djeffal, Toufik Bentrcia, Hichem Ferhati:
Device and Circuit Level Performance Analysis of a New Nanoscale DGJL MOSFET Design Using an Accurate Numerical Computation. ICSENT 2018: 36:1-36:5 - 2011
- [c1]Toufik Bentrcia, Leila Hayet Mouss, Mohamed Djamel Mouss, Mohamed El Hachemi Benbouzid:
Modeling and evaluation of single machine flexibility using fuzzy entropy and genetic algorithm based approach. ETFA 2011: 1-8
Coauthor Index
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