default search action
"Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs ..."
Fayçal Djeffal et al. (2011)
- Fayçal Djeffal, Toufik Bentrcia, Mohamed Amir Abdi, Toufik Bendib:
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectron. Reliab. 51(3): 550-555 (2011)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.