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M. A. Styblinski
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1990 – 1999
- 1997
- [j11]Ming Qu, M. A. Styblinski:
Parameter extraction for statistical IC modeling based on recursive inverse approximation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(11): 1250-1259 (1997) - 1996
- [c16]M. A. Styblinski, Joos Vandewalle, M. Sengupta:
Statistical characterization and optimization of integrated circuits based on singular value decomposition. ICECS 1996: 263-266 - [c15]D. Alexander, M. A. Styblinski:
A new approach to system level modeling and optimization of integrated circuits. ICECS 1996: 382-385 - 1995
- [j10]Syed A. Aftab, M. A. Styblinski:
A new analytical/iterative approach to statistical delay characterization of cmos digital combinational circuits. Int. J. Circuit Theory Appl. 23(1): 23-47 (1995) - [c14]Ming Qu, M. A. Styblinski:
An Adaptive Approach to Statistical Macromodeling of Analog Integrated Circuits. ISCAS 1995: 1596-1599 - [c13]M. Sengupta, M. A. Styblinski:
An Efficient Jacobian Updating Technique for Analog Circuit Optimization. ISCAS 1995: 2144-2147 - [c12]M. A. Styblinski, Ming Qu:
Comparison of Symbolic Approximation and Macromodelling Techniques for Statistical Design of Analog Integrated Circuits. ISCAS 1995: 2221-2224 - 1994
- [c11]Syed A. Aftab, M. A. Styblinski:
A new efficient approach to statistical delay modeling of CMOS digital combinational circuits. ICCAD 1994: 200-203 - [c10]Ming Qu, M. A. Styblinski:
Statistical Characterization and Modeling of Analog Functional Blocks. ISCAS 1994: 121-124 - [c9]Syed A. Aftab, M. A. Styblinski:
IC Variability Minimization using a New Cp and Cpk Based Variability/Performance Measure. ISCAS 1994: 149-152 - 1993
- [j9]M. A. Styblinski, Min Huang:
Drift reliability optimization in IC design: generalized formulation and practical examples. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(8): 1242-1252 (1993) - [j8]M. A. Styblinski, Syed A. Aftab:
Combination of interpolation and self-organizing approximation techniques-a new approach to circuit performance modeling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(11): 1775-1785 (1993) - [c8]Jian Chen, M. A. Styblinski:
A Systematic Approach of Statistical Modeling and Its Application to CMOS Circuits. ISCAS 1993: 1805-1808 - [c7]Ming Qu, M. A. Styblinski:
A Heursitsic Global Optimization Algorithm and Its Application to CMOS Circuit Variability Minimization. ISCAS 1993: 1809-1812 - [c6]B. R. S. Rodrigues, M. A. Styblinski:
Adaptive Hierarchical Multi-objective Fuzzy Optimization for Circuit Design. ISCAS 1993: 1813-1816 - 1992
- [c5]Leszek J. Opalski, M. A. Styblinski:
GOSSIP: a generic system for statistical circuit design. EURO-DAC 1992: 572-577 - [c4]Min Huang, M. A. Styblinski:
A generic software system for drift reliability optimization of VLSI circuits. EURO-DAC 1992: 578-583 - 1991
- [j7]R. M. Biernacki, M. A. Styblinski:
Efficient performance function interpolation scheme and its application to statistical circuit design. Int. J. Circuit Theory Appl. 19(4): 403-422 (1991) - [j6]M. A. Styblinski, B. D. Meyer:
Signal Flow Graphs vs Fuzzy Cognitive Maps in Application to Qualitative Circuit Analysis. Int. J. Man Mach. Stud. 35(2): 175-186 (1991) - [c3]M. A. Styblinski, J. C. Zhang:
Circuit Performance Variability Reduction: Principles, Problems, and Practical Solutions. ICCAD 1991: 170-173 - 1990
- [j5]M. A. Styblinski, Tian-Shen Tang:
Experiments in nonconvex optimization: Stochastic approximation with function smoothing and simulated annealing. Neural Networks 3(4): 467-483 (1990) - [c2]M. A. Styblinski:
Design for Circuit Quality: Yield Maximization, Minimax, and Taguchi Approach. ICCAD 1990: 112-115
1980 – 1989
- 1988
- [j4]Tian-Shen Tang, M. A. Styblinski:
Yield optimization for nondifferentiable density functions using convolution techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(10): 1053-1067 (1988) - [c1]M. A. Styblinski, B. D. Meyer:
Fuzzy cognitive maps, signal flow graphs, and qualitative circuit analysis. ICNN 1988: 549-556 - 1986
- [j3]M. A. Styblinski:
Problems of Yield Gradient Estimation for Truncated Probability Density Functions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 30-38 (1986) - [j2]M. A. Styblinski, Leszek J. Opalski:
Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication Parameters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 79-89 (1986) - [j1]Leszek J. Opalski, M. A. Styblinski:
Generalization of Yield Optimization Problem: Maximum Income Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(2): 346-360 (1986)
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