"A new analytical/iterative approach to statistical delay characterization ..."

Syed A. Aftab, M. A. Styblinski (1995)

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DOI: 10.1002/CTA.4490230104

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type: Journal Article

metadata version: 2025-01-19

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Syed A. Aftab, M. A. Styblinski:
A new analytical/iterative approach to statistical delay characterization of cmos digital combinational circuits. Int. J. Circuit Theory Appl. 23(1): 23-47 (1995)

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