"Design for Circuit Quality: Yield Maximization, Minimax, and Taguchi Approach."

M. A. Styblinski (1990)

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DOI: 10.1109/ICCAD.1990.129855

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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M. A. Styblinski:
Design for Circuit Quality: Yield Maximization, Minimax, and Taguchi Approach. ICCAD 1990: 112-115

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