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ORCIDJuan Du 0009
Person information
- affiliation (PhD 2019): Peking University, Department of Industrial Engineering and Management, Beijing, China
- affiliation (since 2017): Georgia Institute of Technology, H. Milton Stewart School of Industrial and Systems Engineering, Atlanta, GA, USA
Other persons with the same name
- Juan Du — disambiguation page
- Juan Du 0001 — Tongji University, School of Economics and Management, China (and 1 more)
- Juan Du 0002
![[0000-0003-3658-8240]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0003-3658-8240")
— Charite Universitätsmedizin Berlin, Campus Virchow-Klinikum, Germany (and 1 more) - Juan Du 0003 — Qingdao Agricultural University, College of Life Science, China (and 1 more)
- Juan Du 0004 — Shanghai University, SHU-UTS Business School, China
- Juan Du 0005 — Xidian University, Xi'an, China
- Juan Du 0006 — Amazon, Seattle, WA, USA (and 1 more)
- Juan Du 0007 — Singapore Management University, Singapore
- Juan Du 0008 — Nanyang Institute of Technology, Nanyang, China
- Juan Du 0010 — South China University of Technology, Guangzhou, China
- Juan Du 0011 — Chinese Academy of Sciences, Institute of Atmospheric Physics, Beijing, China (and 1 more)
- Juan Du 0012 — Technical University of Munich, Germany
- Juan Du 0013 — Drexel University, School of Biomedical Engineering, Science and Health Systems, Philadelphia, PA, USA
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2020 – today
- 2024
[j8]Yukun Xie, Juan Du, Jianguo Wu:
APFC: Adaptive Particle Filter for Change Point Detection of Profile Data in Manufacturing Systems. IEEE Trans Autom. Sci. Eng. 21(4): 7143-7157 (2024)- [c1]Yukun Xie, Juan Du, Fugee Tsung, Peng Wan, Guanghua Xu:
FIT3D: Real-time Flatness Inspection Algorithm for Ceramic Tiles using the Structured Light 3D Scanner. CASE 2024: 897-903 - [i3]Yanrong Li, Juan Du, Fugee Tsung, Wei Jiang:
Tensor-based process control and monitoring for semiconductor manufacturing with unstable disturbances. CoRR abs/2401.17573 (2024) - [i2]Yukun Xie, Juan Du, Chen Zhang:
DeepFunction: Deep Metric Learning-based Imbalanced Classification for Diagnosing Threaded Pipe Connection Defects using Functional Data. CoRR abs/2404.03329 (2024) - 2023
- [j7]Xingchen Liu, Juan Du, Zhisheng Ye:
A Covariate-Regulated Sparse Subspace Learning Model and Its Application to Process Monitoring and Fault Isolation. Technometrics 65(2): 269-280 (2023) - [i1]Hao Xu, Juan Du, Andi Wang:
Ano-SuPs: Multi-size anomaly detection for manufactured products by identifying suspected patches. CoRR abs/2309.11120 (2023) - 2022
- [j6]Andi Wang, Juan Du, Xi Zhang, Jianjun Shi:
Ranking Features to Promote Diversity: An Approach Based on Sparse Distance Correlation. Technometrics 64(3): 384-395 (2022) - [j5]Juan Du, Shanshan Cao, Jeffrey H. Hunt, Xiaoming Huo, Jianjun Shi:
A New Sparse-Learning Model for Maximum Gap Reduction of Composite Fuselage Assembly. Technometrics 64(3): 409-418 (2022) - [j4]Xingchen Liu, Juan Du, Zhi-Sheng Ye:
A Condition Monitoring and Fault Isolation System for Wind Turbine Based on SCADA Data. IEEE Trans. Ind. Informatics 18(2): 986-995 (2022) - 2021
- [j3]Feng Wang, Juan Du, Yang Zhao, Tao Tang, Jianjun Shi:
A Deep Learning Based Data Fusion Method for Degradation Modeling and Prognostics. IEEE Trans. Reliab. 70(2): 775-789 (2021)
2010 – 2019
- 2019
- [j2]Juan Du, Xi Zhang, Jianjun Shi:
A Physics-Specific Change Point Detection Method Using Torque Signals in Pipe Tightening Processes. IEEE Trans Autom. Sci. Eng. 16(3): 1289-1300 (2019) - 2017
- [j1]Juan Du, Xi Zhang, Qingpei Hu:
An Automatic Condition Detection Approach for Quality Assurance in Solar Cell Manufacturing Processes. IEEE Robotics Autom. Lett. 2(3): 1825-1831 (2017)
Coauthor Index
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