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ORCIDShah M. Jahinuzzaman
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Journal Articles
- 2012
[j4]Wasim Hussain, Shah M. Jahinuzzaman:
A read-decoupled gated-ground SRAM architecture for low-power embedded memories. Integr. 45(3): 229-236 (2012)- 2011
- [j3]Mohammad Sharifkhani, Ehsan Rahiminejad
, Shah M. Jahinuzzaman, Manoj Sachdev:
A Compact Hybrid Current/Voltage Sense Amplifier With Offset Cancellation for High-Speed SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 19(5): 883-894 (2011) - 2009
- [j2]Shah M. Jahinuzzaman, Jaspal Singh Shah, David J. Rennie, Manoj Sachdev:
Design and Analysis of A 5.3-pJ 64-kb Gated Ground SRAM With Multiword ECC. IEEE J. Solid State Circuits 44(9): 2543-2553 (2009) - [j1]Shah M. Jahinuzzaman, Mohammad Sharifkhani, Manoj Sachdev:
An Analytical Model for Soft Error Critical Charge of Nanometric SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 17(9): 1187-1195 (2009)
Conference and Workshop Papers
- 2015
- [c7]Norbert Seifert, Shah M. Jahinuzzaman, Jyothi Velamala, Nikunj Patel:
Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets. IRPS 2015: 2 - 2011
- [c6]Wasim Hussain, Shah M. Jahinuzzaman:
A 7T SRAM bit-cell for low-power embedded memories. ACM Great Lakes Symposium on VLSI 2011: 121-126 - 2010
- [c5]Hourieh Attarzadeh, Mohammad Sharifkhani, Shah M. Jahinuzzaman:
A scalable offset-cancelled current/voltage sense amplifier. ISCAS 2010: 3853-3856 - 2008
- [c4]Shah M. Jahinuzzaman, Tahseen Shakir, Sumanjit Lubana, Jaspal Singh Shah, Manoj Sachdev:
A multiword based high speed ECC scheme for low-voltage embedded SRAMS. ESSCIRC 2008: 226-229 - [c3]Shah M. Jahinuzzaman, Mohammad Sharifkhani, Manoj Sachdev:
Investigation of Process Impact on Soft Error Susceptibility of Nanometric SRAMs Using a Compact Critical Charge Model. ISQED 2008: 207-212 - 2007
- [c2]Mohammad Sharifkhani, Shah M. Jahinuzzaman, Manoj Sachdev:
Dynamic Data Stability in Low-power SRAM Design. CICC 2007: 237-240 - 2006
- [c1]Mohammad Sharifkhani, Shah M. Jahinuzzaman, Manoj Sachdev:
Dynamic Data Stability in SRAM Cells and Its Implications on Data Stability Tests. MTDT 2006: 55-64
Coauthor Index
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