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ORCIDDimitrios N. Kouvatsos
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Journal Articles
- 2010
[j8]Despina C. Moschou
, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
On the importance of the Vg, max-Vth parameter on LTPS TFT stressing behavior. Microelectron. Reliab. 50(2): 190-194 (2010)- 2008
- [j7]Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas:
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectron. Reliab. 48(8-9): 1544-1548 (2008) - 2007
- [j6]Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas:
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. Microelectron. Reliab. 47(9-11): 1378-1383 (2007) - [j5]F. V. Farmakis, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. Microelectron. Reliab. 47(9-11): 1434-1438 (2007) - [j4]Vojkan Davidovic, Dimitrios N. Kouvatsos, Ninoslav Stojadinovic, Apostolos T. Voutsas:
Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 47(9-11): 1841-1845 (2007) - [j3]Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47(12): 2058-2064 (2007) - 2004
- [j2]Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis:
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44(9-11): 1631-1636 (2004) - 2002
- [j1]Dimitrios N. Kouvatsos:
On-state and off-state stress-induced degradation in unhydrogenated solid phase crystallized polysilicon thin film transistors. Microelectron. Reliab. 42(12): 1875-1882 (2002)
Coauthor Index
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