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Daniel Vanderstraeten
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2020 – today
- 2020
- [c2]John M. McGlone, Guy Brizar, Daniel Vanderstraeten, Dorai Iyer, Sallie Hose, Jeff P. Gambino:
Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage. IRPS 2020: 1-5
2010 – 2019
- 2013
- [c1]Jan Ackaert, Aditi Malik, Daniel Vanderstraeten:
Impact of the leadframe profile on the occurrence of passivation cracks of plastic-encapsulated electronic power devices. ICICDT 2013: 93-96 - 2012
- [j3]Andrej Ivankovic, Kris Vanstreels, Daniel Vanderstraeten, Guy Brizar, Renaud Gillon, Eddy Blansaer, Bart Vandevelde:
Comparison of experimental methods for the extraction of the elastic modulus of molding compounds used in IC packaging. Microelectron. Reliab. 52(11): 2677-2684 (2012) - 2010
- [j2]Sergey Bychikhin, Georg Haberfehlner, J. Rhayem, Daniel Vanderstraeten, Renaud Gillon, Dionyz Pogany:
Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation. Microelectron. Reliab. 50(9-11): 1427-1430 (2010)
2000 – 2009
- 2004
- [j1]Jason Y. L. Goh, Mark C. Pitter, Chung W. See, Michael G. Somekh, Daniel Vanderstraeten:
Sub-pixel image correlation: an alternative to SAM and dye penetrant for crack detection and mechanical stress localisation in semiconductor packages. Microelectron. Reliab. 44(2): 259-267 (2004)
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last updated on 2024-10-07 22:16 CEST by the dblp team
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