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Chung W. See

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2000 – 2009

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2004
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Jason Y. L. Goh, Mark C. Pitter, Chung W. See, Michael G. Somekh, Daniel Vanderstraeten:
Sub-pixel image correlation: an alternative to SAM and dye penetrant for crack detection and mechanical stress localisation in semiconductor packages. Microelectron. Reliab. 44(2): 259-267 (2004)
2001
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Mark C. Pitter, Chung W. See, Michael G. Somekh:
Fast subpixel digital image correlation using artificial neural networks. ICIP (2) 2001: 901-904

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