• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 50 matches

• 2010
• 
  Daniel W. Apley:
  Comment. Technometrics 52(3): 277-280 (2010)
• 
  Sunanda Bagchi:
  Main-Effect Plans Orthogonal Through the Block Factor. Technometrics 52(2): 243-249 (2010)
• 
  Richard A. Becker, Chris Volinsky, Allan R. Wilks:
  Fraud Detection in Telecommunications: History and Lessons Learned. Technometrics 52(1): 20-33 (2010)
• 
  Ryan P. Browne, R. Jock MacKay, Stefan H. Steiner:
  Leveraged Gauge R&R Studies. Technometrics 52(3): 294-302 (2010)
• 
  Javier Cano-Montero, Javier M. Moguerza, David Ríos Insua:
  Bayesian Reliability, Availability, and Maintainability Analysis for Hardware Systems Described Through Continuous Time Markov Chains. Technometrics 52(3): 324-334 (2010)
• 
  Hugh A. Chipman, R. Jock MacKay, Stefan H. Steiner:
  Comment. Technometrics 52(3): 280-283 (2010)
• 
  William J. Conover:
  Letter to the Editor. Technometrics 52(2): 256-257 (2010)
• 
  Yue Cui, James S. Hodges, Xiaoxiao Kong, Bradley P. Carlin:
  Partitioning Degrees of Freedom in Hierarchical and Other Richly Parameterized Models. Technometrics 52(1): 124-136 (2010)
• 
  Tirthankar Dasgupta, Arden Miller, C. F. Jeff Wu:
  Robust Design of Measurement Systems. Technometrics 52(1): 80-93 (2010)
• 
  Holger Dette, Andrey Pepelyshev:
  Generalized Latin Hypercube Design for Computer Experiments. Technometrics 52(4): 421-429 (2010)
• 
  Dorin Drignei:
  Functional ANOVA in Computer Models With Time Series Output. Technometrics 52(4): 430-437 (2010)
• 
  Takeshi Emura, Hsiuying Wang:
  Approximate Tolerance Limits Under Log-Location-Scale Regression Models in the Presence of Censoring. Technometrics 52(3): 313-323 (2010)
• 
  Donald P. Gaver, Patricia A. Jacobs:
  Comment. Technometrics 52(4): 389-391 (2010)
• 
  Massimiliano Giorgio, Maurizio Guida, Gianpaolo Pulcini:
  A State-Dependent Wear Model With an Application to Marine Engine Cylinder Liners. Technometrics 52(2): 172-187 (2010)
• 
  Christopher M. Gotwalt:
  Addendum to "Fast Computation of Designs Robust to Parameter Uncertainty for Nonlinear Settings". Technometrics 52(1): 137 (2010)
• 
  Todd L. Graves, Christine M. Anderson-Cook, Michael S. Hamada:
  Reliability Models for Almost-Series and Almost-Parallel Systems. Technometrics 52(2): 160-171 (2010)
• 
  J. Brian Hall, Paul M. Ellner, Ali Mosleh:
  Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. Technometrics 52(4): 379-389 (2010)
• 
  J. Brian Hall, Paul M. Ellner, Ali Mosleh:
  Rejoinder. Technometrics 52(4): 401-408 (2010)
• 
  David J. Hand:
  Fraud Detection in Telecommunications and Banking: Discussion of Becker, Volinsky, and Wilks (2010) and Sudjianto et al. (2010). Technometrics 52(1): 34-38 (2010)
• 
  Martin L. Hazelton:
  Statistical Inference for Transit System Origin-Destination Matrices. Technometrics 52(2): 221-230 (2010)
• 
  Matthew J. Heaton, C. Shane Reese, William F. Christensen:
  Incorporating Time-Dependent Source Profiles Using the Dirichlet Distribution in Multivariate Receptor Models. Technometrics 52(1): 67-79 (2010)
• 
  David Hoffman:
  One-Sided Tolerance Limits for Balanced and Unbalanced Random Effects Models. Technometrics 52(3): 303-312 (2010)
• 
  Yili Hong, William Q. Meeker:
  Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information. Technometrics 52(2): 148-159 (2010)
• 
  Aparna V. Huzurbazar, Brian J. Williams:
  Incorporating Covariates in Flowgraph Models: Applications to Recurrent Event Data. Technometrics 52(2): 198-208 (2010)
• 
  Jeroen de Mast, Wessel N. van Wieringen:
  Modeling and Evaluating Repeatability and Reproducibility of Ordinal Classifications. Technometrics 52(1): 94-106 (2010)
• 
  Robert H. Mitchell:
  Announcement of 2010 Hunter Award. Technometrics 52(2): 147 (2010)
• 
  Patrick D. T. O'Connor:
  Comment. Technometrics 52(4): 391-392 (2010)
• 
  Peihua Qiu, Changliang Zou, Zhaojun Wang:
  Nonparametric Profile Monitoring by Mixed Effects Modeling. Technometrics 52(3): 265-277 (2010)
• 
  Peihua Qiu, Changliang Zou, Zhaojun Wang:
  Rejoinder. Technometrics 52(3): 288-293 (2010)
• 
  Xianggui Qu:
  Optimal Row-Column Designs in High-Throughput Screening Experiments. Technometrics 52(4): 409-420 (2010)

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