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Technometrics, Volume 52
Volume 52, Number 1, 2010
- David M. Steinberg:
Mini-Issue on Anomaly Detection. 4
- Agus Sudjianto, Sheela Nair, Ming Yuan, Aijun Zhang, Daniel A. Kern, Fernando Cela-Díaz:
Statistical Methods for Fighting Financial Crimes. 5-19 - Richard A. Becker, Chris Volinsky, Allan R. Wilks:
Fraud Detection in Telecommunications: History and Lessons Learned. 20-33 - David J. Hand:
Fraud Detection in Telecommunications and Banking: Discussion of Becker, Volinsky, and Wilks (2010) and Sudjianto et al. (2010). 34-38 - Galit Shmueli, Howard S. Burkom:
Statistical Challenges Facing Early Outbreak Detection in Biosurveillance. 39-51 - Adrian E. Raftery, Miroslav Kárný, Pavel Ettler:
Online Prediction Under Model Uncertainty via Dynamic Model Averaging: Application to a Cold Rolling Mill. 52-66 - Matthew J. Heaton, C. Shane Reese, William F. Christensen:
Incorporating Time-Dependent Source Profiles Using the Dirichlet Distribution in Multivariate Receptor Models. 67-79 - Tirthankar Dasgupta, Arden Miller, C. F. Jeff Wu:
Robust Design of Measurement Systems. 80-93 - Jeroen de Mast, Wessel N. van Wieringen:
Modeling and Evaluating Repeatability and Reproducibility of Ordinal Classifications. 94-106 - Grzegorz Wylupek:
Data-Driven k-Sample Tests. 107-123 - Yue Cui, James S. Hodges, Xiaoxiao Kong, Bradley P. Carlin:
Partitioning Degrees of Freedom in Hierarchical and Other Richly Parameterized Models. 124-136
- Christopher M. Gotwalt:
Addendum to "Fast Computation of Designs Robust to Parameter Uncertainty for Nonlinear Settings". 137
Volume 52, Number 2, 2010
- Robert H. Mitchell:
Announcement of 2010 Hunter Award. 147
- Yili Hong, William Q. Meeker:
Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information. 148-159 - Todd L. Graves, Christine M. Anderson-Cook, Michael S. Hamada:
Reliability Models for Almost-Series and Almost-Parallel Systems. 160-171 - Massimiliano Giorgio, Maurizio Guida, Gianpaolo Pulcini:
A State-Dependent Wear Model With an Application to Marine Engine Cylinder Liners. 172-187 - Xiao Wang, Dihua Xu:
An Inverse Gaussian Process Model for Degradation Data. 188-197 - Aparna V. Huzurbazar, Brian J. Williams:
Incorporating Covariates in Flowgraph Models: Applications to Recurrent Event Data. 198-208 - Kazuyuki Suzuki, Toshie Nakamoto, Yohtaro Matsuo:
Optimum Specimen Sizes and Sample Allocation for Estimating Weibull Shape Parameters for Two Competing Failure Modes. 209-220 - Martin L. Hazelton:
Statistical Inference for Transit System Origin-Destination Matrices. 221-230 - Pi-Wen Tsai, Steven G. Gilmour:
A General Criterion for Factorial Designs Under Model Uncertainty. 231-242 - Sunanda Bagchi:
Main-Effect Plans Orthogonal Through the Block Factor. 243-249 - Kenneth Joseph Ryan, Dursun A. Bulutoglu:
Minimum Aberration Fractional Factorial Designs With Large N. 250-255
- William J. Conover:
Letter to the Editor. 256-257
Volume 52, Number 3, 2010
- Peihua Qiu, Changliang Zou, Zhaojun Wang:
Nonparametric Profile Monitoring by Mixed Effects Modeling. 265-277 - Daniel W. Apley:
Comment. 277-280 - Hugh A. Chipman, R. Jock MacKay, Stefan H. Steiner:
Comment. 280-283 - Fugee Tsung:
Comment. 283-285 - William H. Woodall, Jeffrey B. Birch, Pang Du:
Comment. 285-287 - Peihua Qiu, Changliang Zou, Zhaojun Wang:
Rejoinder. 288-293 - Ryan P. Browne, R. Jock MacKay, Stefan H. Steiner:
Leveraged Gauge R&R Studies. 294-302 - David Hoffman:
One-Sided Tolerance Limits for Balanced and Unbalanced Random Effects Models. 303-312 - Takeshi Emura, Hsiuying Wang:
Approximate Tolerance Limits Under Log-Location-Scale Regression Models in the Presence of Censoring. 313-323 - Javier Cano-Montero, Javier M. Moguerza, David Ríos Insua:
Bayesian Reliability, Availability, and Maintainability Analysis for Hardware Systems Described Through Continuous Time Markov Chains. 324-334 - Jin Zhang:
Improving on Estimation for the Generalized Pareto Distribution. 335-339 - Huiping Xu, Bruce A. Craig:
Likelihood Analysis of Multivariate Probit Models Using a Parameter Expanded MCEM Algorithm. 340-348 - Shifeng Xiong:
Some Notes on the Nonnegative Garrote. 349-361
Volume 52, Number 4, 2010
- David M. Steinberg:
Editor's Report. 376-378
- J. Brian Hall, Paul M. Ellner, Ali Mosleh:
Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. 379-389 - Donald P. Gaver, Patricia A. Jacobs:
Comment. 389-391 - Patrick D. T. O'Connor:
Comment. 391-392 - Ananda Sen, Arthur Fries:
Comment. 393-395 - Nozer D. Singpurwalla:
Comment. 396-397 - Alyson G. Wilson, Christine M. Anderson-Cook:
Comment. 397-400 - J. Brian Hall, Paul M. Ellner, Ali Mosleh:
Rejoinder. 401-408 - Xianggui Qu:
Optimal Row-Column Designs in High-Throughput Screening Experiments. 409-420 - Holger Dette, Andrey Pepelyshev:
Generalized Latin Hypercube Design for Computer Experiments. 421-429 - Dorin Drignei:
Functional ANOVA in Computer Models With Time Series Output. 430-437 - Panagiotis Tsiamyrtzis, Douglas M. Hawkins:
Bayesian Startup Phase Mean Monitoring of an Autocorrelated Process That Is Subject to Random Sized Jumps. 438-452 - Bing Xing Wang, Keming Yu, M. C. Jones:
Inference Under Progressively Type II Right-Censored Sampling for Certain Lifetime Distributions. 453-460
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