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"Implementation, Test Pattern Generation, and Comparative Analysis of ..."

Vikas K. Saini, Shamim Akhter, Tanuj Chauhan (2016)

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DOI: 10.1155/2016/1260879

access: open

type: Journal Article

metadata version: 2019-06-02

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  - https://dblp.org/rec/journals/vlsi/SainiAC16
Vikas K. Saini, Shamim Akhter, Tanuj Chauhan:
Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits. VLSI Design 2016: 1260879:1-1260879:8 (2016)

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