"A New HEMT Breakdown Model Incorporating Gate and Thermal Effects."

Lutfi Albasha, Christopher M. Snowden, Roger D. Pollard (1998)

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DOI: 10.1155/1998/37965

access: open

type: Journal Article

metadata version: 2023-05-08

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Lutfi Albasha, Christopher M. Snowden, Roger D. Pollard:
A New HEMT Breakdown Model Incorporating Gate and Thermal Effects. VLSI Design 8(1-4): 349-353 (1998)

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