"Compact Test Generation With an Influence Input Measure for ..."

Dong Xiang et al. (2014)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2013.2280170

access: closed

type: Journal Article

metadata version: 2022-12-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/XiangSYC14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/XiangSYC14
Dong Xiang, Wenjie Sui, Boxue Yin, Kwang-Ting Cheng:
Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing. IEEE Trans. Very Large Scale Integr. Syst. 22(9): 1968-1979 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.