"Built-in self-test (BIST) design of high-speed carry-free dividers."

Chin-Long Wey (1996)

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DOI: 10.1109/92.486089

access: closed

type: Journal Article

metadata version: 2020-03-11

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Chin-Long Wey:
Built-in self-test (BIST) design of high-speed carry-free dividers. IEEE Trans. Very Large Scale Integr. Syst. 4(1): 141-145 (1996)

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