"Fuzzy-based CMOS circuit partitioning in built-in current testing."

Wang-Dauh Tseng, Kuochen Wang (1999)

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DOI: 10.1109/92.748207

access: closed

type: Journal Article

metadata version: 2020-03-11

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Wang-Dauh Tseng, Kuochen Wang:
Fuzzy-based CMOS circuit partitioning in built-in current testing. IEEE Trans. Very Large Scale Integr. Syst. 7(1): 116-120 (1999)

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