"A Built-in Self-Diagnosis and Repair Design With Fail Pattern ..."

Chin-Lung Su et al. (2011)

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DOI: 10.1109/TVLSI.2010.2073489

access: closed

type: Journal Article

metadata version: 2023-09-30

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Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu:
A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2184-2194 (2011)

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