"Construction of SEU Tolerant Flip-Flops Allowing Enhanced Scan Delay Fault ..."

Kazuteru Namba, Takashi Ikeda, Hideo Ito (2010)

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DOI: 10.1109/TVLSI.2009.2022083

access: closed

type: Journal Article

metadata version: 2020-03-11

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Kazuteru Namba, Takashi Ikeda, Hideo Ito:
Construction of SEU Tolerant Flip-Flops Allowing Enhanced Scan Delay Fault Testing. IEEE Trans. Very Large Scale Integr. Syst. 18(9): 1265-1276 (2010)

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