"Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information."

Yerzhan Mustafa, Selçuk Köse (2024)

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DOI: 10.1109/TVLSI.2024.3385014

access: closed

type: Journal Article

metadata version: 2024-07-04

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Yerzhan Mustafa, Selçuk Köse:
Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information. IEEE Trans. Very Large Scale Integr. Syst. 32(6): 1100-1109 (2024)

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