"Built-In Self-Test Methodology With Statistical Analysis for Electrical ..."

Woongrae Kim et al. (2016)

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DOI: 10.1109/TVLSI.2015.2513369

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type: Journal Article

metadata version: 2022-01-03

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Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim, Linda Milor:
Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array. IEEE Trans. Very Large Scale Integr. Syst. 24(7): 2521-2534 (2016)

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