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"An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation."
John Keane, Tony Tae-Hyoung Kim, Chris H. Kim (2010)
- John Keane, Tony Tae-Hyoung Kim, Chris H. Kim:
An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation. IEEE Trans. Very Large Scale Integr. Syst. 18(6): 947-956 (2010)
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