"Improving path delay testability of sequential circuits."

Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell (2000)

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DOI: 10.1109/92.902268

access: closed

type: Journal Article

metadata version: 2020-03-11

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Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
Improving path delay testability of sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 736-741 (2000)

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