"Power Management Using Test-Pattern Ordering for Wafer-Level Test During ..."

Sudarshan Bahukudumbi, Krishnendu Chakrabarty (2009)

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DOI: 10.1109/TVLSI.2008.2006679

access: closed

type: Journal Article

metadata version: 2022-01-03

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Sudarshan Bahukudumbi, Krishnendu Chakrabarty:
Power Management Using Test-Pattern Ordering for Wafer-Level Test During Burn-In. IEEE Trans. Very Large Scale Integr. Syst. 17(12): 1730-1741 (2009)

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