"Analysis and On-Chip Monitoring of Gate Oxide Breakdown in SRAM Cells."

Fahad Ahmed, Linda Milor (2012)

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DOI: 10.1109/TVLSI.2011.2119500

access: closed

type: Journal Article

metadata version: 2022-01-03

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Fahad Ahmed, Linda Milor:
Analysis and On-Chip Monitoring of Gate Oxide Breakdown in SRAM Cells. IEEE Trans. Very Large Scale Integr. Syst. 20(5): 855-864 (2012)

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