"A Yield and Reliability Improvement Methodology Based on Logic Redundant ..."

Masanori Kurimoto et al. (2012)

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DOI: 10.1145/2159542.2159549

access: closed

type: Journal Article

metadata version: 2018-11-06

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Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui, Michio Komoda, Nobuhiro Tsuda:
A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule. ACM Trans. Design Autom. Electr. Syst. 17(2): 17:1-17:22 (2012)

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