"The reliability of semiconductor RAM memories with on-chip ..."

Rodney M. Goodman, Masahiro Sayano (1991)

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DOI: 10.1109/18.79957

access: closed

type: Journal Article

metadata version: 2020-03-10

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Rodney M. Goodman, Masahiro Sayano:
The reliability of semiconductor RAM memories with on-chip error-correction coding. IEEE Trans. Inf. Theory 37(3): 884-896 (1991)

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