"Application of Blind Deconvolution Denoising in Failure Prognosis."

Bin Zhang et al. (2009)

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DOI: 10.1109/TIM.2008.2005963

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/tim/ZhangKPVOS09
Bin Zhang, Taimoor Khawaja, Romano Patrick, George J. Vachtsevanos, Marcos E. Orchard, Abhinav Saxena:
Application of Blind Deconvolution Denoising in Failure Prognosis. IEEE Trans. Instrum. Meas. 58(2): 303-310 (2009)

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