"A Novel Pixel-Wise Defect Inspection Method Based on Stable Background ..."

Chengkan Lv et al. (2021)

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DOI: 10.1109/TIM.2020.3038413

access: closed

type: Journal Article

metadata version: 2021-08-02

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Chengkan Lv, Fei Shen, Zhengtao Zhang, De Xu, Yonghao He:
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction. IEEE Trans. Instrum. Meas. 70: 1-13 (2021)

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