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ORCIDFei Shen 0002
Person information
- affiliation: Chinese Academy of Sciences, Institute of Automation, Beijing, China
Other persons with the same name
- Fei Shen — disambiguation page
- Fei Shen 0001
![[0000-0001-8534-3421]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0001-8534-3421")
— Chinese Academy of Sciences, Shanghai Institute of Microsystem and Information Technology, Key Laboratory of Wireless Sensor Network and Communications, Shanghai, China - Fei Shen 0003 — Southeast University, Nanjing, China
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2020 – today
- 2024
[j8]Han Gao, Huiyuan Luo, Fei Shen, Zhengtao Zhang:
A Norm-Constrained Method for Semantic and Structured Anomaly Detection Tasks. IEEE Trans. Instrum. Meas. 73: 1-13 (2024)- [c5]Qingfeng Shi, Jing Wei, Fei Shen, Zhengtao Zhang:
Few-Shot Defect Image Generation Based on Consistency Modeling. ECCV (76) 2024: 360-376 - [i5]Zhen Qu, Xian Tao, Mukesh Prasad, Fei Shen, Zhengtao Zhang, Xinyi Gong, Guiguang Ding:
VCP-CLIP: A visual context prompting model for zero-shot anomaly segmentation. CoRR abs/2407.12276 (2024) - 2023
- [j7]Zhen Qu, Xian Tao, Fei Shen, Zhengtao Zhang, Tao Li:
Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation. IEEE Trans. Instrum. Meas. 72: 1-17 (2023) - [c4]Chengkan Lv, Zhengtao Zhang, Fei Shen, Feng Zhang:
Unsupervised Automatic Defect Inspection based on Image Matching and Local One-class Classification. CVPR Workshops 2023: 4435-4444 - [c3]Jing Wei, Fei Shen, Chengkan Lv, Zhengtao Zhang, Feng Zhang, Huabin Yang:
Diversified and Multi-Class Controllable Industrial Defect Synthesis for Data Augmentation and Transfer. CVPR Workshops 2023: 4445-4453 - [i4]Han Gao, Huiyuan Luo, Fei Shen, Zhengtao Zhang:
Towards Total Online Unsupervised Anomaly Detection and Localization in Industrial Vision. CoRR abs/2305.15652 (2023) - [i3]Xian Tao, Zhen Qu, Hengliang Luo, Jianwen Han, Yonghao He, Danfeng Liu, Chengkan Lv, Fei Shen, Zhengtao Zhang:
The Second-place Solution for CVPR VISION 23 Challenge Track 1 - Data Effificient Defect Detection. CoRR abs/2306.14116 (2023) - [i2]Han Gao, Huiyuan Luo, Fei Shen, Zhengtao Zhang:
Exploring the Optimization Objective of One-Class Classification for Anomaly Detection. CoRR abs/2308.11898 (2023) - [i1]Zhen Qu, Xian Tao, Fei Shen, Zhengtao Zhang, Tao Li:
Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation. CoRR abs/2309.16902 (2023) - 2022
- [c2]Shaohu Wang, Fangbo Qin, Fei Shen, Zhengtao Zhang:
Flexible 3D Object Appearance Observation Based on Pose Regression and Active Motion. CASE 2022: 895-900 - 2021
- [j6]Jiabin Zhang, Hu Su, Wei Zou, Xinyi Gong, Zhengtao Zhang, Fei Shen:
CADN: A weakly supervised learning-based category-aware object detection network for surface defect detection. Pattern Recognit. 109: 107571 (2021) - [j5]Fei Shen, Fangbo Qin, Zhengtao Zhang, De Xu, Juan Zhang, Wenrong Wu:
Automated Pose Measurement Method Based on Multivision and Sensor Collaboration for Slice Microdevice. IEEE Trans. Ind. Electron. 68(1): 488-498 (2021) - [j4]Chengkan Lv, Fei Shen, Zhengtao Zhang, De Xu, Yonghao He:
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction. IEEE Trans. Instrum. Meas. 70: 1-13 (2021)
2010 – 2019
- 2018
- [j3]Xinyi Gong, Hu Su, De Xu, Zhengtao Zhang, Fei Shen, Hua-Bin Yang:
An Overview of Contour Detection Approaches. Int. J. Autom. Comput. 15(6): 656-672 (2018) - [j2]Fangbo Qin, Fei Shen, Dapeng Zhang, Xilong Liu, De Xu:
Contour Primitives of Interest Extraction Method for Microscopic Images and Its Application on Pose Measurement. IEEE Trans. Syst. Man Cybern. Syst. 48(8): 1348-1359 (2018) - 2017
- [j1]Song Liu, De Xu, Youfu Li, Fei Shen, Dapeng Zhang:
Nanoliter Fluid Dispensing Based on Microscopic Vision and Laser Range Sensor. IEEE Trans. Ind. Electron. 64(2): 1292-1302 (2017) - 2016
- [c1]Fangbo Qin, De Xu, Fei Shen, Dapeng Zhang, Xilong Liu:
Calibration with ball objects for telecentric micro-vision system. CASE 2016: 948-953
Coauthor Index
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