"A Novel Statistical Timing and Leakage Power Characterization of Partially ..."

Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi (2009)

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DOI: 10.1109/TIM.2008.2003322

access: closed

type: Journal Article

metadata version: 2020-06-08

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Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi:
A Novel Statistical Timing and Leakage Power Characterization of Partially Depleted Silicon-on-Insulator Gates. IEEE Trans. Instrum. Meas. 58(2): 401-410 (2009)

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