"Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image."

Yiping Liang et al. (2024)

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DOI: 10.1109/TII.2023.3298469

access: closed

type: Journal Article

metadata version: 2024-09-17

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Yiping Liang, Libing Bai, Lulu Tian, Xu Zhang, Chao Ren, Dan Shao, Zhenzhong Ma, Mosi Sun:
Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image. IEEE Trans. Ind. Informatics 20(2): 2884-2896 (2024)

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