"A Probabilistic Fault Detection Approach: Application to Bearing Fault ..."

Bin Zhang et al. (2011)

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DOI: 10.1109/TIE.2010.2058072

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tie/0008SBPOV11
Bin Zhang, Chris Sconyers, Carl S. Byington, Romano Patrick, Marcos E. Orchard, George J. Vachtsevanos:
A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection. IEEE Trans. Ind. Electron. 58(5): 2011-2018 (2011)

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