"Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse ..."

Ray-Bing Chen, Weichung Wang, C. F. Jeff Wu (2017)

> Home

Details and statistics

DOI: 10.1080/00401706.2016.1172027

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/technometrics/ChenWW17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/technometrics/ChenWW17
Ray-Bing Chen, Weichung Wang, C. F. Jeff Wu:
Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling. Technometrics 59(2): 139-152 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.