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Technometrics, Volume 59
Volume 59, Number 1, 2017
- Matthias Hwai Yong Tan:
Monotonic Metamodels for Deterministic Computer Experiments. 1-10 - Weitao Duan, Bruce E. Ankenman, Susan M. Sanchez, Paul J. Sanchez:
Sliced Full Factorial-Based Latin Hypercube Designs as a Framework for a Batch Sequential Design Algorithm. 11-22 - Andrew J. Henrey, Thomas M. Loughin:
Joint Identification of Location and Dispersion Effects in Unreplicated Two-Level Factorials. 23-35 - (Withdrawn) Design and Analysis of Experiments on Nonconvex Regions. 36-47
- Anna Errore
, Bradley A. Jones, William Li, Christopher J. Nachtsheim:
Benefits and Fast Construction of Efficient Two-Level Foldover Designs. 48-57 - Xu He, Rui Tuo, C. F. Jeff Wu:
Optimization of Multi-Fidelity Computer Experiments via the EQIE Criterion. 58-68 - Pieter T. Eendebak
, Eric D. Schoen
:
Two-Level Designs to Estimate All Main Effects and Two-Factor Interactions. 69-79 - Jeremy E. Oakley, Benjamin D. Youngman:
Calibration of Stochastic Computer Simulators Using Likelihood Emulation. 80-92 - Matthew J. Heaton, William F. Christensen
, Maria A. Terres:
Nonstationary Gaussian Process Models Using Spatial Hierarchical Clustering from Finite Differences. 93-101 - Hao Yan, Kamran Paynabar, Jianjun Shi
:
Anomaly Detection in Images With Smooth Background via Smooth-Sparse Decomposition. 102-114 - Piao Chen, Zhi-Sheng Ye:
Estimation of Field Reliability Based on Aggregate Lifetime Data. 115-125
- Xiaoming Huo, Gábor J. Székely
:
Clarifications for "Fast Computing for Distance Covariance" by Xiaoming Huo and Gábor J. Székely. 134-135
Volume 59, Number 2, 2017
- Ray-Bing Chen
, Weichung Wang, C. F. Jeff Wu:
Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling. 139-152 - Avishek Chakraborty, Derek Bingham, Soma S. Dhavala, Carolyn C. Kuranz
, R. Paul Drake, Michael J. Grosskopf, Erica M. Rutter, Ben R. Torralva, James Paul Holloway, Ryan G. McClarren
, Bani K. Mallick:
Emulation of Numerical Models With Over-Specified Basis Functions. 153-164 - Matthew Plumlee
, Daniel W. Apley:
Lifted Brownian Kriging Models. 165-177 - Grant Schneider, Peter F. Craigmile, Radu Herbei:
Maximum Likelihood Estimation for Stochastic Differential Equations Using Sequential Gaussian-Process-Based Optimization. 178-188 - Tonglin Zhang, Baijian Yang
:
Box-Cox Transformation in Big Data. 189-201 - Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker:
Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. 202-214 - Xiang Zhang, Alyson G. Wilson
:
System Reliability and Component Importance Under Dependence: A Copula Approach. 215-224 - Zhibing Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz:
A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data. 225-236 - Mimi Zhang
, Min Xie:
An Ameliorated Improvement Factor Model for Imperfect Maintenance and Its Goodness of Fit. 237-246 - Ye Tian, Ranjan Maitra
, William Q. Meeker, Stephen D. Holland:
A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. 247-261 - Konstantinos Fokianos
, Maria Pitsillou:
Consistent Testing for Pairwise Dependence in Time Series. 262-270
Volume 59, Number 3, 2017
- Xinwei Deng, C. Devon Lin, K.-W. Liu, R. Kerry Rowe
:
Additive Gaussian Process for Computer Models With Qualitative and Quantitative Factors. 283-292 - Luc Pronzato, Maria-João Rendas:
Bayesian Local Kriging. 293-304 - Robert W. Mee, Eric D. Schoen
, David J. Edwards:
Selecting an Orthogonal or Nonorthogonal Two-Level Design for Screening. 305-318 - Bradley A. Jones, Christopher J. Nachtsheim:
Effective Design-Based Model Selection for Definitive Screening Designs. 319-329 - Samuel D. Pimentel, Dylan S. Small, Paul R. Rosenbaum:
An Exact Test of Fit for the Gaussian Linear Model Using Optimal Nonbipartite Matching. 330-337 - Yuan Yuan, Nan Chen, Shiyu Zhou:
Modeling Regression Quantile Process Using Monotone B-Splines. 338-350 - Ching-Kang Ing, Tze Leung Lai, Milan Shen, Kawai Tsang
, Shu-Hui Yu:
Multiple Testing in Regression Models With Applications to Fault Diagnosis in the Big Data Era. 351-360 - Anil Damle
, Yuekai Sun:
A Geometric Approach to Archetypal Analysis and Nonnegative Matrix Factorization. 361-370 - Nathaniel T. Stevens, Christine M. Anderson-Cook:
Comparing the Reliability of Related Populations With the Probability of Agreement. 371-380 - Sheng-Tsaing Tseng, Pei-Yu Chen:
A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models. 381-390 - Ling Dong, Xiaodong Li, Dan Yu, Hui Zhang, Zhong Zhang, Yanjun Qian
, Yu Ding:
Quantifying Nanoparticle Mixing State to Account for Both Location and Size Effects. 391-403
- Book Reviews. 404-412
Volume 59, Number 4, 2017
- Daniel W. Apley:
Technometrics 2017 Editor's Report. 413-415
- Xiao Nie, Jared D. Huling, Peter Z. G. Qian:
Accelerating Large-Scale Statistical Computation With the GOEM Algorithm. 416-425 - Xin Zhang, Lexin Li:
Tensor Envelope Partial Least-Squares Regression. 426-436 - Daniel V. Samarov, David Allen, Jeeseong Hwang, Young Jong Lee, Maritoni Litorja:
A Coordinate-Descent-Based Approach to Solving the Sparse Group Elastic Net. 437-445 - Luzia A. Trinca
, Steven G. Gilmour
:
Split-Plot and Multi-Stratum Designs for Statistical Inference. 446-457 - Antony M. Overstall, David C. Woods
:
Bayesian Design of Experiments Using Approximate Coordinate Exchange. 458-470 - Weijie Shen:
Robust Parameter Designs in Computer Experiments Using Stochastic Approximation. 471-483 - Giovanna Capizzi
, Guido Masarotto
:
Phase I Distribution-Free Analysis of Multivariate Data. 484-495 - Dongdong Xiang, Fugee Tsung
, Xiaolong Pu:
Statistical Process Control for Latent Quality Characteristics Using the Up-and-Down Test. 496-507 - Maochao Xu, Lei Hua
, Shouhuai Xu:
A Vine Copula Model for Predicting the Effectiveness of Cyber Defense Early-Warning. 508-520 - Heeyoung Kim, Jaehwan Lee:
Hierarchical Spatially Varying Coefficient Process Model. 521-527 - Piao Chen, Zhi-Sheng Ye, Xingqiu Zhao:
Minimum Distance Estimation for the Generalized Pareto Distribution. 528-541
- Book Reviews. 542-551
- The 2016 Technometrics Prizes. 552-554
- 2016 Ziegel Award Announcement. 555
- Technometrics Editorial Collaborators. 556-557
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