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ORCIDTechnometrics, Volume 59
Volume 59, Number 1, 2017
- Matthias Hwai Yong Tan:
Monotonic Metamodels for Deterministic Computer Experiments. 1-10 - Weitao Duan, Bruce E. Ankenman, Susan M. Sanchez, Paul J. Sanchez:
Sliced Full Factorial-Based Latin Hypercube Designs as a Framework for a Batch Sequential Design Algorithm. 11-22 - Andrew J. Henrey, Thomas M. Loughin:
Joint Identification of Location and Dispersion Effects in Unreplicated Two-Level Factorials. 23-35 - (Withdrawn) Design and Analysis of Experiments on Nonconvex Regions. 36-47
- Anna Errore
, Bradley A. Jones, William Li, Christopher J. Nachtsheim:
Benefits and Fast Construction of Efficient Two-Level Foldover Designs. 48-57 - Xu He, Rui Tuo, C. F. Jeff Wu:
Optimization of Multi-Fidelity Computer Experiments via the EQIE Criterion. 58-68 - Pieter T. Eendebak, Eric D. Schoen:
Two-Level Designs to Estimate All Main Effects and Two-Factor Interactions. 69-79 - Jeremy E. Oakley, Benjamin D. Youngman:
Calibration of Stochastic Computer Simulators Using Likelihood Emulation. 80-92 - Matthew J. Heaton, William F. Christensen, Maria A. Terres:
Nonstationary Gaussian Process Models Using Spatial Hierarchical Clustering from Finite Differences. 93-101 - Hao Yan, Kamran Paynabar, Jianjun Shi:
Anomaly Detection in Images With Smooth Background via Smooth-Sparse Decomposition. 102-114 - Piao Chen, Zhi-Sheng Ye:
Estimation of Field Reliability Based on Aggregate Lifetime Data. 115-125
- Xiaoming Huo, Gábor J. Székely:
Clarifications for "Fast Computing for Distance Covariance" by Xiaoming Huo and Gábor J. Székely. 134-135
Volume 59, Number 2, 2017
- Ray-Bing Chen, Weichung Wang, C. F. Jeff Wu:
Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling. 139-152 - Avishek Chakraborty, Derek Bingham, Soma S. Dhavala, Carolyn C. Kuranz, R. Paul Drake, Michael J. Grosskopf, Erica M. Rutter, Ben R. Torralva, James Paul Holloway, Ryan G. McClarren, Bani K. Mallick:
Emulation of Numerical Models With Over-Specified Basis Functions. 153-164 - Matthew Plumlee, Daniel W. Apley:
Lifted Brownian Kriging Models. 165-177 - Grant Schneider, Peter F. Craigmile, Radu Herbei:
Maximum Likelihood Estimation for Stochastic Differential Equations Using Sequential Gaussian-Process-Based Optimization. 178-188 - Tonglin Zhang, Baijian Yang:
Box-Cox Transformation in Big Data. 189-201 - Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker:
Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. 202-214 - Xiang Zhang, Alyson G. Wilson:
System Reliability and Component Importance Under Dependence: A Copula Approach. 215-224 - Zhibing Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz:
A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data. 225-236 - Mimi Zhang, Min Xie:
An Ameliorated Improvement Factor Model for Imperfect Maintenance and Its Goodness of Fit. 237-246 - Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland:
A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. 247-261 - Konstantinos Fokianos, Maria Pitsillou:
Consistent Testing for Pairwise Dependence in Time Series. 262-270
Volume 59, Number 3, 2017
- Xinwei Deng, C. Devon Lin, K.-W. Liu, R. Kerry Rowe:
Additive Gaussian Process for Computer Models With Qualitative and Quantitative Factors. 283-292 - Luc Pronzato, Maria-João Rendas:
Bayesian Local Kriging. 293-304 - Robert W. Mee, Eric D. Schoen, David J. Edwards:
Selecting an Orthogonal or Nonorthogonal Two-Level Design for Screening. 305-318 - Bradley A. Jones, Christopher J. Nachtsheim:
Effective Design-Based Model Selection for Definitive Screening Designs. 319-329 - Samuel D. Pimentel, Dylan S. Small, Paul R. Rosenbaum:
An Exact Test of Fit for the Gaussian Linear Model Using Optimal Nonbipartite Matching. 330-337 - Yuan Yuan, Nan Chen, Shiyu Zhou:
Modeling Regression Quantile Process Using Monotone B-Splines. 338-350 - Ching-Kang Ing, Tze Leung Lai, Milan Shen, Kawai Tsang, Shu-Hui Yu:
Multiple Testing in Regression Models With Applications to Fault Diagnosis in the Big Data Era. 351-360 - Anil Damle, Yuekai Sun:
A Geometric Approach to Archetypal Analysis and Nonnegative Matrix Factorization. 361-370 - Nathaniel T. Stevens, Christine M. Anderson-Cook:
Comparing the Reliability of Related Populations With the Probability of Agreement. 371-380 - Sheng-Tsaing Tseng, Pei-Yu Chen:
A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models. 381-390 - Ling Dong, Xiaodong Li, Dan Yu, Hui Zhang, Zhong Zhang, Yanjun Qian, Yu Ding:
Quantifying Nanoparticle Mixing State to Account for Both Location and Size Effects. 391-403
- Book Reviews. 404-412
Volume 59, Number 4, 2017
- Daniel W. Apley:
Technometrics 2017 Editor's Report. 413-415
- Xiao Nie, Jared D. Huling, Peter Z. G. Qian:
Accelerating Large-Scale Statistical Computation With the GOEM Algorithm. 416-425 - Xin Zhang, Lexin Li:
Tensor Envelope Partial Least-Squares Regression. 426-436 - Daniel V. Samarov, David Allen, Jeeseong Hwang, Young Jong Lee, Maritoni Litorja:
A Coordinate-Descent-Based Approach to Solving the Sparse Group Elastic Net. 437-445 - Luzia A. Trinca, Steven G. Gilmour:
Split-Plot and Multi-Stratum Designs for Statistical Inference. 446-457 - Antony M. Overstall, David C. Woods:
Bayesian Design of Experiments Using Approximate Coordinate Exchange. 458-470 - Weijie Shen:
Robust Parameter Designs in Computer Experiments Using Stochastic Approximation. 471-483 - Giovanna Capizzi, Guido Masarotto:
Phase I Distribution-Free Analysis of Multivariate Data. 484-495 - Dongdong Xiang, Fugee Tsung, Xiaolong Pu:
Statistical Process Control for Latent Quality Characteristics Using the Up-and-Down Test. 496-507 - Maochao Xu, Lei Hua, Shouhuai Xu:
A Vine Copula Model for Predicting the Effectiveness of Cyber Defense Early-Warning. 508-520 - Heeyoung Kim, Jaehwan Lee:
Hierarchical Spatially Varying Coefficient Process Model. 521-527 - Piao Chen, Zhi-Sheng Ye, Xingqiu Zhao:
Minimum Distance Estimation for the Generalized Pareto Distribution. 528-541
- Book Reviews. 542-551
- The 2016 Technometrics Prizes. 552-554
- 2016 Ziegel Award Announcement. 555
- Technometrics Editorial Collaborators. 556-557
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