"A High-Speed, Low-Power, High-Reliability and Fully Single Event Double ..."

Jiaxin Yang et al. (2025)

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DOI: 10.1109/TCSI.2024.3438282

access: closed

type: Journal Article

metadata version: 2025-02-14

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Jiaxin Yang, Ziyang Guo, Shixuan Wang, Jilong Liu, Yue Zhang, Weisheng Zhao, Lang Zeng, Deming Zhang:
A High-Speed, Low-Power, High-Reliability and Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory. IEEE Trans. Circuits Syst. I Regul. Pap. 72(1): 192-202 (2025)

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