"A Capacitively Coupled CT Δ ΣM With Chopping Artifacts Rejection ..."

Chaegang Lim et al. (2021)

> Home

Details and statistics

DOI: 10.1109/TCSI.2021.3084350

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcasI/LimCPSAPK21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcasI/LimCPSAPK21
Chaegang Lim, Yohan Choi, Yunsoo Park, Jaegeun Song, Soonsung Ahn, Sooho Park, Chulwoo Kim:
A Capacitively Coupled CT Δ ΣM With Chopping Artifacts Rejection for Sensor Readout ICs. IEEE Trans. Circuits Syst. I Regul. Pap. 68(8): 3242-3253 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.