"A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End ..."

Chi-Wei Huang et al. (2023)

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DOI: 10.1109/TCSI.2023.3254891

access: closed

type: Journal Article

metadata version: 2023-06-15

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Chi-Wei Huang, Chin-Kai Lai, Chung-Chih Hung, Chung-Yu Wu, Ming-Dou Ker:
A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit With ±3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs. IEEE Trans. Circuits Syst. I Regul. Pap. 70(6): 2257-2270 (2023)

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