"Circuit Reliability Comparison Between Stochastic Computing and Binary ..."

Zuodong Zhang et al. (2020)

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DOI: 10.1109/TCSII.2020.2993273

access: closed

type: Journal Article

metadata version: 2024-06-03

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Zuodong Zhang, Runsheng Wang, Zhe Zhang, Yawen Zhang, Shaofeng Guo, Ru Huang:
Circuit Reliability Comparison Between Stochastic Computing and Binary Computing. IEEE Trans. Circuits Syst. 67-II(12): 3342-3346 (2020)

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