"Dynamic Reference Voltage Sensing Scheme for Read Margin Improvement in ..."

Kien Trinh Quang, Sergio Ruocco, Massimo Alioto (2018)

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DOI: 10.1109/TCSI.2017.2749522

access: closed

type: Journal Article

metadata version: 2020-05-22

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Kien Trinh Quang, Sergio Ruocco, Massimo Alioto:
Dynamic Reference Voltage Sensing Scheme for Read Margin Improvement in STT-MRAMs. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(4): 1269-1278 (2018)

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