"Efficient ECSM Characterization Considering Voltage, Temperature, and ..."

Baljit Kaur et al. (2014)

> Home

Details and statistics

DOI: 10.1109/TCSI.2014.2336511

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/KaurAMA14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/KaurAMA14
Baljit Kaur, Naushad Alam, S. K. Manhas, Bulusu Anand:
Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability. IEEE Trans. Circuits Syst. I Regul. Pap. 61-I(12): 3407-3415 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.